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Originally Posted by bigben2k
As Al suggested, there's an opportunity to measure IHS tim variation, which means that one would have to measure the temp on both sides of the IHS.
Added: I'm not sure that Derek is willing to groove the IHS. As long as one can replicate the top side measurement, it's all good.
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I'm not sure its necessary:
Ok, so from Derek's test bench status thread, he's got wires on the cpu diode pins and a custom reader, hopefully no interaction from motherboard?
So anyway, he would have to do this to every cpu he tests, and in theory would get diff. temps each time. However the waterblock would be the same, so then he pops the IHS off the cpus and tests again and all temp readings should be the same now (assuming same conditions, same under-load wattage dump, etc...) within error margin. Since the baseline are all the same, but with IHS on the temps are NOT all the same, conclusion is there is variability in IHS joint.
*again, assumes cpus and load conditions are identical - many will argue against but is there data to say otherwise?
--Jay