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Originally Posted by BillA
(and there seem to be others now carrying the 'IHS= no test' banner)
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That is not what I said. I said one of two things:
1) Prove that the IHS is not a major variability issue, or if it is an issue, at least quantify its variability, with respect to CPU temp vs IHS temp
2) If we are able to know the die temp, then measure the IHS temp to your hearts content.
I did not say "IHS = no test".
"Blame it on Stew".
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Stew, I continue to be annoyed by the effects of your tutelage
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Interesting, given that it was yourself who started the die-sim kick a few years back, expressing great and public disdain towards all things "real world". My tutelage? No sir. You are far guiltier of such tutelage than I have ever been. The difference here is that you seek to make a U-turn.
"Blame it on Stew".
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there is more in my quote of the day if you seek heartburn
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Your quote of the day gives me no heart-burn at all. Read points 1 & 2 above. The only issue I have with your quote of the day is your own libelous association that such a comment has anything to do with what I've been pushing for, quite consistently.
As par for Bill, "Blame it on Stew".
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when your position evolves from pronouncements of unacceptability to an accomodation with product/testing reality, I'll cut you some slack
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I thought I had been discussing points 1 & 2 all this time. Oh well.
"Blame it on Stew".
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- a co I work with just evaluated die sims, identified the preferred configuration, and concluded 'hell no'; no desire to design, build, and validate such a complex device
lab tools are fine, but very expensive
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Guess this must be my fault too, eh?
